A Novel CSRR-Loaded High-Sensitivity SIW Resonator for Measuring Permittivity of Materials

Abstract

In this paper, a new structure combining substrate integrated waveguide (SIW) resonator and complementary split-ring resonator (CSRR) is proposed, which is used to measure the permittivity of low-loss materials in C-band. The resonant frequency of the SIW resonant cavity is affected by the material by inserting materials into the center of the SIW resonant cavity. The inverse problem of obtaining permittivity is solved by artificial neural network. Simulation results show that by adding CSRR structure to both sides of the SIW resonator, the resonant frequency of the resonator cavity will change greatly. The measurement sensitivity of SIW resonator with CSRR structure is always higher than that of ordinary SIW resonator.