Wavelet Analysis of RTS Noise in CMOS Image Sensors Irradiated With High-Energy Photons

Abstract

This article explores the phenomenon of dark current random telegraph signal (DC-RTS) noise in commercial off-the-shelf CMOS image sensors. Five sensors were irradiated with high-energy photons to a variety of doses and analyzed with a wavelet-based signal reconstruction algorithm. The algorithm is explained in detail and the radiation effects on individual pixels are discussed. Finally, the production rate of RTS pixels as a function of dose is explored, providing information on the underlying defect structure responsible for this noise source.