Abstract
A waveguide dispersion measurement technique using a simple fitting function for wavelength dependence of the root-mean-square width in the far field and its theoretical measurement error are discussed. Results indicate that waveguide dispersion can be evaluated with theoretical accuracy of 0.5 ps/km/nm using this technique. The waveguide dispersions for conventional and dispersion-shifted fibers have been measured using the far-field pattern method. Good agreement between measured and theoretical values of waveguide dispersion was obtained. Material dispersion and dispersion sensitivity evaluation methods that are applications of this technique are also described.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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