Abstract
On passing through a thin crystalline silicon wafer, the profile of an infrared laser beam is changed from a quasi-Gaussian to a flat-top one, improving the LIBS technique's analytical performance. That is the proposed (WELIBS) Wavefront-enhanced laser-induced breakdown spectroscopy approach.
Published Version
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have