VxG Pattern-Based Analysis and Battery Deterioration Diagnosis

Abstract

This paper presents the results of an analysis using the direct current internal resistance (DCIR) method on a nickel-cobalt-manganese oxide (NCM)-based battery with a nominal capacity of 55.6 Ah. The accelerated degradation test was performed on V0G, V1G, and V2G patterns, representing existing simple power supply, smart charging control, and bi-directional charge/discharge control, respectively. We assumed V0G, V1G, and V2G patterns and conducted charging and discharging experiments according to the set conditions. According to the pattern repetition, changes in the internal resistance of DCIR and AC-impedance were analyzed and battery deterioration was diagnosed. By comparing DCIR and AC-impedance, we confirmed that the changes in internal resistance has a similar trend. In particular, we propose a new DCIR analysis method in the “stop-operation” part rather than the traditional DCIR method. In the case of traditional DCIR method, time is required for the battery to stabilize. However, the newly proposed DCIR analysis method has the advantage of diagnosing the deterioration of the battery during system operation by analyzing the internal resistance without the stabilization time of the battery.