Abstract
To study the pancake-vortex states confined in a submicron Bi2Sr2CaCu2O8+y (Bi2212) crystal, we have measured the c-axis resistance and I-V characteristics of a stack of intrinsic Josephson junctions with a lateral dimension less than 1 µm. Although the stack was accidentally shunted by a parallel resistance of 7.5 kΩ, the I-V characteristics show homogeneous multiple branches after the subtraction of the component. The penetrations of single vortices into the submicron stack were clearly observed in the resistance measurements. A vortex phase diagram was constructed by mapping the c-axis resistance on an H-T plane. Temperature dependence of the first-vortex penetration field is consistent with the theoretical estimation on the formation of a pancake-vortex stack in the center of a superconducting strip.
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