Abstract

The anisotropy of critical current density is an impressive manifestation in the physics of high-temperature superconductors. We develop an analytical characterization of anisotropic flux-lattice pinning and critical current density in a system of random point defects. The effect of superconducting anisotropy on the pinning force and critical current density is formulated. The in-plane/out-of-plane anisotropy and microscopic characteristic lengths are incorporated in the field and angular dependence of the critical current density. This is helpful in understanding the physical essence of the scaling behavior in the experiments for critical current anisotropy. We discuss the role of strong and weak point defects in the anisotropic flux-lattice pinning. Relevance of the theory to the critical-state model is dictated as well.

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