Abstract
In this study, we extensively used electron backscatter diffraction orientation imaging microscopy to visualize the grain structure in the flat-rolled (Bi,Pb)2Sr2Ca2Cu3O x (Bi-2223) tapes. The thermomechanical process made the grains’ c-axes oriented normal to the tape surface. The 24% difference in critical current density J c was caused by the ∼5° difference in the degree of out-of-plane texture. Although the in-plane orientations are not controlled, the Bi-2223 grains can form the domains, each of which consists of the grains with similar in-plane orientation. Controlling the domain formation could be the next protocol to raise the J c of Bi-2223 tapes.
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