Visualisation of three-dimensional microstructures

Abstract

A variety of techniques are now available which can yield three-dimensional data on the atomic scale microstructures of materials. These include sequences of field-ion micrographs, field evaporation microscopy and direct chemical measurements from three-dimensional atom probes such as the position-sensitive atom probe. Methods of computer reconstruction of the microstructures from the various forms of data are discussed, together with the problems associated with the different data types. Despite the different methods for the collection of microstructural data, a common format is produced which allows topological measurements to be performed.