Very-Low Voltage (VLV) and VLV Ratio (VLVR) Testing for Quality, Reliability, and Outlier Detection

Jeffrey Roehr

doi:10.1109/test.2006.297690

Very-Low Voltage (VLV) and VLV Ratio (VLVR) Testing for Quality, Reliability, and Outlier Detection

Jeffrey Roehr

https://doi.org/10.1109/test.2006.297690

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Publication Date: Oct 1, 2006

Citations: 59

#Very-Low Voltage #Voltage Testing + Show 8 more

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Abstract

A new implementation of Very-Low Voltage (VLV) and Minimum Voltage (Min_Vdd) testing, the VLV Ratio test (VLVR) is proposed to improve product quality and reliability by detecting fabrication and test outliers. The VLVR technique was also used to assist in the diagnosis of a stress induced failure mechanism in a 0.13 micron Low Power (LP) CMOS process.

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