Abstract
A new implementation of Very-Low Voltage (VLV) and Minimum Voltage (Min_Vdd) testing, the VLV Ratio test (VLVR) is proposed to improve product quality and reliability by detecting fabrication and test outliers. The VLVR technique was also used to assist in the diagnosis of a stress induced failure mechanism in a 0.13 micron Low Power (LP) CMOS process.
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