Abstract
After a short theoretical exposition of a method for compensating inaccuracies in parallel-diode switch-gates, a linear gate circuit is presented which is based on the described principle. Accurate measurements of differential linearity error in the whole dynamic range (0–10 V) have been done. The results of experimental checks of rise time, pedestal, rejection factor, and thermal stability are also given. The circuit which operates with gating pulses longer than 30 nsec is believed to introduce a considerable improvement in comparison with previously given solutions, mainly from the linearity point of view.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
