Abstract
Arrays with YBa/sub 2/Cu/sub 3/O/sub 7/-Josephson junction ramp-edge geometry and on bicrystal substrates were investigated. The ramp-edge Josephson junctions were prepared in arrays of three, five and seven junctions in series and in a mixed array with a very large number of up to two million on one chip. First measurements are presented. On bicrystal substrates Josephson junctions were prepared up to 105 Josephson junctions in series. They show scaled current-voltage characteristics and Shapiro-steps under influence of microwave radiation.
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