Abstract
In the EUREKA EU205 project the target products are industrial excimer lasers in the average power range of one kilowatt or more. The high power optical components and dielectric coatings have to be developed in close adaption to cavity design (optics), beam relay optics, mask imaging optics, and masks. Therefore, we used ultra low loss conventional e-beam evaporation for Al 2 O 3 /SiO 2 dielectric multilayers. Based on a fundamental coating technique, both multilayer mean background absorption and absorption at localized spikes have been reduced drastically. The resulting KrF laser damage threshold of HR coatings is 16 J/cm 2 (1-on-1, 30 ns, EMG-202-MSC). Measurements have been performed with an automated damage testing facility, being part of the EUREKA program. Multilayers have been characterized by Atomic Force Microscopy, Photothermal Microscopy, absorption measurements, and Spectroscopy of Sputtered Neutrals.
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