Abstract
Variable coherence microscopy, a tool for quantitative analysis of structural fluctuations in disordered materials, is introduced. The method involves transmission electron microscopy of thin films and uses hollow-cone illumination. Experiments were performed on annealed evaporated amorphous germanium. Although many aspects of the data agree with the continuous random network model, there is experimental evidence for additional medium-range structure on the 10–20 A scale.
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