Abstract
Rydberg-assisted atomic electrometry using alkali-metal atoms contained inside a vacuum environment for detecting external electric fields (E-fields) at frequencies $<$ a few kHz has been quite challenging due to the low-frequency E-field screening effect that is caused by the alkali-metal atoms adsorbed on the inner surface of the container. We report a very slow E-field screening phenomenon with a time scale up to $\sim$ second on a rubidium (Rb) vapor cell that is made of monocrystalline sapphire. Using this sapphire-made Rb vapor cell with optically induced, internal bias E-field, we demonstrate vapor-cell-based, low-frequency atomic electrometry that responds to the E-field strength linearly. Limited by the given experimental conditions, this demonstrated atomic electrometer uses an active volume of 11 mm$^3$ and delivers a spectral noise floor around $0.34$ (mV/m)/$\sqrt{\rm Hz}$ and the 3-dB low cut-off frequency around 770 Hz inside the vapor cell. This work investigates a regime of vapor-cell-based atomic electrometry that was seldom studied before, which may enable more applications that utilize atomic E-field sensing technology.
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