Abstract
A study was carried out with two 732B model Zener-diode based electronic voltage standards, in order to analyze the influence of external temperature variation in their outputs. The temperature was controlled and the external variations were monitored. Inmetro Programmable Josephson Voltage Standard (PJVS) and Secondary systems were used for this purpose. Studies have shown that, despite the internal temperature control, there is a strong correlation between the external temperature and the internal thermistor value, for both Zeners. Inmetro Zener calibration uncertainty budget was revisited and the achieved uncertainties are ±0.09 μV (at 1.018 V) and ±0.4 μV (at 10 V), k=2.
Highlights
Zener-diode based solid state electronic voltage standards (Zeners) are used worldwide by National Metrology Institutes (NMIs) [1]
1/f noise in Zeners are the ultimate limit to Zener voltage measurement uncertainties; calibration using Zeners as reference standards are limited to one part in 108 [3]
Thanks to its internal temperature control, this variation is small: the Zener internal temperature drops around 0.03 °C for each 1 °C increase in the external temperature, for the tested Zeners
Summary
Zener-diode based solid state electronic voltage standards (Zeners) are used worldwide by National Metrology Institutes (NMIs) [1]. The Zeners calibrated using a JVS are used as a reference standard (in the Secondary system) to calibrate Inmetro client's Zeners (from the Brazilian Network Calibration), which are used to provide traceability to all other laboratories and research institutes in Brazil [2]. 1/f noise in Zeners are the ultimate limit to Zener voltage measurement uncertainties; calibration using Zeners as reference standards are limited to one part in 108 [3]. The present work shows some results related to the Zener output voltage variation under the presence of controlled external temperature, targeting lower uncertainties calibration in the Secondary system
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