Abstract
This work is an assessment of contactless techniques for space hardware ground testing and characterization. It is based on Fourier Transform Infrared (FT-IR) spectroscopy, namely a commercially available portable FT-IR instrument operating in reflection and transmission measurements at a considerable distance from the measured surfaces. The two methodologies are evaluated namely related to 1) molecular contamination monitoring, and 2) materials identification. These techniques can provide important information in support of Manufacturing, Assembly, Integration and Testing activities as well as non-conformance investigations. Non-contact characterization techniques are particularly relevant when dealing with sensitive surfaces and/or surfaces with limited access such as optical components already integrated in the optical bench.
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