Abstract

Polarization modeling by means of the Mueller matrix formalism is widely used for representation and optimization of the performance of complex polarization-sensitive systems. Yet, this turns out to be a challenge, as soon as such systems become dynamic, as is the case with scanning systems using polarized light. This work explores the possible use of dynamic Mueller matrices, in order to enable modeling of the optical system at any given moment, regardless of the position or orientation of any moving part. To achieve this, first the dynamic optical part (or a whole optical module) is measured using ellipsometry, to obtain several Mueller matrices characterizing the part at different moments in time. Then, all transitional matrices are calculated by means of interpolating their elements. This method is particularly useful when modeling scanning systems employing a scanning mirror. The author demonstrates its performance on a retinal birefringence scanning system. It was shown that the system itself is changing polarization quite significantly. It was determined how the six degenerate states can be changed by the dynamic system alone, and which Stokes vector elements are most prone to matrix element fluctuations. It is also suggested that a dynamic Mueller matrix can facilitate precise polarization modeling, and accelerate system optimization.

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