Use of test structures for characterization and modeling of inter- and intra-layer capacitances in a CMOS process

Abstract

In this paper, we present a global approach for inter- and intralayer capacitance characterization and modeling. Using an accurate on-chip measurement method, we have characterized realistic test patterns, i.e., test patterns consistent with capacitive couplings encountered in a layout. These reference values have allowed us to point out some limitations of current models and to propose new simple analytical models suitable for small dimension capacitive patterns. This paper emphasizes inter- and intralayer modeling.