Abstract
A low-energy electron diffraction (LEED) system has been used to study the energy spectra of Auger electrons from clean and alkali-covered Ge and Si surfaces. Auger bands characteristic of the substrates were observed for the clean surfaces and the deposition of submonolayer coverages of K and Cs introduced new bands characteristic of the respective alkali. It is shown that a surface impurity in a quantity as small as 0.1 monolayer can be detected and identified by this measurement.
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