Abstract
The use of a microprocessor as a controller in digital testing is usually restricted by the relatively low operating speed of the microprocessor. Two different approaches to building a microprocessor-based digital test system are discussed and compared in this paper. It is found that if a high-speed test pattern repetition rate is not a necessary requirement, the semidynamic approach which tests and analyzes the UUT on a real-time basis will result in a faster and simpler configuration.
Published Version
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