Abstract
An X-ray detector with a dielectric (KU1 optical glass) used as a sensitive element is described. Operation of the detector is based on the discovered effect of electric-field generation in a dielectric under exposure to radiation. The measurements were taken at the Angara-5-1 facility, at which the radiation source is megaampere Z-pinch plasma. It is shown that when the radiation power incident on the detector is approximately 1 MW/cm2, the detector response is a few volts with a time resolution of 1–2 ns. This effect is thought to be caused by “hot” electrons induced by radiation in the dielectric. The estimates for these experimental conditions are presented.
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