Abstract
A complete modular data acquisition system based on a fieldprogrammable gate array (FPGA) and dedicated for high resolution, fastX-Ray elemental mapping has been designed and realized. The system issuitable for application with both X-ray (XRF) and Charged Particles(PIXE) excitation beams. Each board serves four channels and comprisesan analog and a digital section. The analog section is composed offour semi-Gaussian shaping amplifiers with two software-selectableshaping times. The shaping times (150 and 450 ns) were chosen toperform either high rate or best resolution XRF measurements withstate-of-the-art silicon drift detectors (SDD). The pulse amplitude iscaught by four large bandwidth peak-stretchers whose outputs aremultiplexed into a single 10 MHz 14-bit analog-to-digital converter(ADC). The FPGA operates at 48 MHz clock frequency and controls thewhole process. The on-chip RAM stores the four acquired spectra. Thespectra are sent to the host PC via USB2.0 interface. Custom madecontrol software provides data visualization and analysis.
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