Abstract
On copper doped ZnO-crystals the angular, doping and temperature dependence of the ESR line width has been investigated. The measurements on different conventionally and radiochemically doped ZnO-crystals show the strong influence of the perfectness of the crystals on the line width. By the measured temperature dependence of the line width is deduced, that the spin-lattice relaxation mechanism between 7 and 17 °K is a Raman process.
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