Abstract
The ECAL Barrel and MTD Barrel Timing Layer subdetectors of CMS are approaching series production of electronic boards, including voltage conditioning PCBs: LVRs and PCCs respectively. 2448 LVRs and 864 PCCs will be installed during LS3 of the LHC. These boards are hosting radiation-tolerant bPOL12V ASICs which convert a broad input voltage range into required voltage levels for microelectronics between 1.2–2.5 V. Each card must be tested multiple times at various production stages to ensure its conformity. This contribution describes a methodology of testing bPOL12V conversion quality including the detection of instability regions at certain load levels.
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