Abstract
ABSTRACTThe classical double well potential (DWP) model known to explain many phenomena in glasses, is extended to the nano glasses of chalcogenide phase change memory (PCM). We describe simple analytical expressions for the temporal drift of PCM reset parameters. The threshold voltage Vth and the amorphous state resistance R are shown to drift with the time (t) as deltaVth ∝ ν propotional to ln t and R proportional to t power alpha respectively in broad intervals spanning many decades in time. These dependencies saturate at long enough times that can be shorten with temperature increase. All the available data on the PCM drift are shown to be fully consistent with DWP model.
Published Version
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