Abstract
This work presents a novel method for fast characterization of broadband and continuous dielectric properties of microwave substrates based on an ungrounded coplanar waveguide (UGCPW) structure containing two simple straight lines. The proposed method could, to some extent, alleviate the derivation error due to connector soldering and device fabrication. To verify this point, theoretical analysis and result comparisons are carried out. By considering both the conductor loss and radiation loss, the dielectric loss tangent can be retrieved with a high precision. The deviation of the measured dielectric constant and dielectric loss tangent are found to be within 0.03 (0.68%, 4.37 vs 4.40) and 0.0013 (6.5%, 0.0213 vs 0.02), respectively, in the range from 12 to 20 GHz, which is more accurate than the results reported in the literature, all while the proposed extraction approach is simpler than other methods such as the wave cascading matrix (WCM) algorithm. Due to the UGCPW configuration, this method is suitable for property evaluation of emerging synthesized dielectric materials, as a single round of electroplating process is required for device design, which can eliminate possible consistency error in conductor thickness and roughness caused by multiple electroplating process.
Highlights
Before designing microwave devices, it is crucially important to accurately understand the dielectric properties of the used substrate materials, especially their dielectric constants
We propose an optimized method based on the ungrounded coplanar waveguide (UGCPW) configuration with two simple straight lines for fast characterizing dielectric materials at microwave frequencies
The transmission phase ∅ may have a certain deviation due to the influence of connectors, soldering, and fabrication inaccuracy, which would inevitably result in errors in the extracted effective dielectric constant and substrate dielectric constant. Such error occurs in the retrieved substrate dissipation factor as well. To tackle with this problem, we propose an optimized method with two UGCPW straight lines to reduce the error caused by the factors mentioned above, which can increase the reliability of the obtained substrate dielectric constant εr and the dissipation factor tan δ
Summary
It is crucially important to accurately understand the dielectric properties of the used substrate materials, especially their dielectric constants. We propose an optimized method based on the ungrounded coplanar waveguide (UGCPW) configuration with two simple straight lines for fast characterizing dielectric materials at microwave frequencies.
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