Abstract
To optimize the functioning of electronics and photonic devices, we need to understand the underlying mechanisms that govern their behaviors during operation. We already have access to a variety of techniques for characterizing device performance during equilibrium; however, we have limited options for making measurements during device operation. A recent development in scanning voltage microscopy (SVM) has enabled the characterization of the internal behavior of operating devices. The work at the Khalifa University of Science and Research in the United Arab Emirates and the University of Waterloo in Ontario, Canada, is focused on using SVM to measure the electrical properties of quantum cascade and interband cascade lasers. The first article, Scanning Voltage Microscopy for Emerging Electronic and Photonic Devices by Mahmud et al., discusses the fabrication process of the nanotips and the effects of the nanotip shape on its measurement ability.
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