Abstract
The paper presents the results of scanning tunnelling microscopy investigation of electron field emission from multilayer nanostructures based on silica opal film Cr-SiO2-Au-C. Opal film was deposited in colloidal solvent, while other films – by vacuum deposition methods. We discuss the problem of uncertainty of measurements of the field enhancement factor and carbon nano-edge sizes using the current versus applied voltage characteristics of the emission. Field enhancement factor is defined as the ratio of the electric field at the nano-edge to the field applied to the gap. We found that at well-controlled experimental conditions the combined uncertainty of field enhancement factor measurements is ∼15% based on a 95% confidence interval and the combined uncertainty of nano-edge sizes measurements is ∼18% based on a 95% confidence interval.
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