Ultra-Thin p+ Layers in GaAs

Abstract

AbstractThe formation of shallow (0.05–0.2 μm) p+ layers in GaAs by pulse diffusion of Zn from a doped oxide source, thermal diffusion of Cd by vapor transport, or by low energy implantation of Cd, Mg, Be, Zn or Hg ions was investigated by electrochemical capacitance-voltage profiling, Secondary Ion Mass Spectrometry, Rutherford backscattering and Hall measurements. Hole densities in excess of 1019 cm−3 are obtainable by either Zn diffusion or acceptor implantation, though the high temperature cycle must be kept to ≤3 sec at (≤1000°C to prevent excessive redistribution of the acceptor dopants. Pulse diffusion at temperature °C leads to shallow regions with atomic concentrations above 1019 cm−3, but electrically active concentrations orders of magnitude less. These results are explained in terms of the unavailability of a sufficient density of vacancies at low temperatures.