Abstract
The interface position of a CaF2 crystal was successfully monitored during growth using an innovative ultrasonic sensor system. The sensor system utilizes a top entry approach consisting of probe rods permanently positioned at the bottom of the crucible. Ultrasonic time of flight data (TOF) is used to determine interface position. (© 2005 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)
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