Abstract
Resistance thermometry provides a time-tested method for taking temperature measurements. However, fundamental limits to resistance-based approaches has produced considerable interest in developing photonic temperature sensors to leverage advances in frequency metrology and to achieve greater mechanical and environmental stability. Here we show that silicon-based optical ring resonator devices can resolve temperature differences of 1 mK using the traditional wavelength scanning methodology. An even lower noise floor of 80 μK for measuring temperature difference is achieved in the side-of-fringe, constant power mode measurement.
Highlights
23. DisclaimerCertain equipment or materials are identified in this paper in order to specify the experimental procedure adequately
Temperature measurements play a central role in modern life ranging from process control in manufacturing [1], physiological monitoring [2, 3] and tissue ablation [4] in medicine, and environmental control and monitoring in buildings [5] and automobiles [6]
We demonstrate an alternative approach to Wavelength Scanning mode for measuring temperature changes smaller than 1 mK. In this measurement scheme–side of fringe, constant power mode–the laser power is maintained at a constant power level and its frequency centered on the side of resonance at the point of steepest descent
Summary
Certain equipment or materials are identified in this paper in order to specify the experimental procedure adequately. Such identification is not intended to imply endorsement by the National Institute of Standards and Technology, nor is it intended to imply that the materials or equipment identified are necessarily the best available. Lukosz, “Integrated optical switches and gas sensors,” Opt. Lett. Lukosz, “Grating couplers as integrated optical humidity and gas sensors,” Thin Solid. E. Scholten, “Frequency noise characterisation of narrow linewidth diode lasers,” Opt. Commun. S. Grudinin, “Fundamental thermal fluctuations in microspheres,” J.
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