Abstract
A nanometer-scale recording technique was demonstrated on N-(3-nitrobenzylidene)–p-phenylenediamine (NBPDA) organic thin films with a scanning tunneling microscope (STM). NBPDA thin films were fabricated by vacuum thermal deposition. The results of ultraviolet-visible absorption and infrared transmission spectra showed that the structure of the NBPDA film was the same as that of NBPDA crystal. An atomic force microscope was utilized to characterize the surface morphology of the NBPDA film. Data were recorded by applying voltage pulses between the tip and the substrate. The current–voltage characteristics measured by the STM indicated that the local electrical property changed from an insulating property into a metallic property after the data were written. Data marks, 1.4 nm in diameter, corresponded to a data storage density of 1012 bits/cm2. A preliminary calculation was presented to explain the recording mechanism.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
