Abstract
Abstract Advanced microwave technologies constitute the foundation of a wide range of modern sciences, including microwave integrated circuits, quantum computing, microwave photonics, spintronics, etc. To facilitate the design of chip-based microwave devices, there is an increasing demand for state-of-the-art microscopic techniques capable of characterizing the near-field microwave distribution and performance. In this work, we integrate Josephson junctions onto a nano-sized quartz tip, forming a highly sensitive microwave mixer on-tip. This allows us to conduct spectroscopic imaging of near-field microwave distributions with high spatial resolution. Leveraging its microwave-sensitive characteristics, our Josephson microscopy achieves a broad detecting bandwidth of up to 200 GHz, as well as remarkable frequency and intensity resolutions. Near-field characterizations of microwave circuits are also conducted to demonstrate the capabilities of Josephson microscopy. Our work emphasizes the benefits of utilizing Josephson microscopy as a real-time, non-destructive technique to advance integrated microwave devices.
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