Abstract
Grain size pays a crucial role in the properties of ferroelectrics and dielectrics. Reducing the grain size is considered to be an effective mean for enhancing dielectric energy storage. In this work, high recovered energy storage density and efficiency were achieved in three-layered Aurivillius thin films by ultra-fine grain nano-crystalline engineering. The ultra-low remanent polarization can be attributed to the emergence of polar nano-regions due to the disruption of macroscopic continuity of ferroelectric domains by ultra-fine nano-grains. At the same time, all thin films have high dielectric breakdown strength due to the presence of extremely high grain boundary density. Thus, a high recovered energy storage density of 71 J/cm3 and an efficiency of 76% were achieved, and the thin film capacitors show good fatigue endurance and temperature stability. The results suggest that ultra-fine nano-crystalline engineering can expand the application of traditional ferroelectric thin films in energy storage devices.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
