Abstract
We investigate numerically and experimentally resonance properties of light reflected under condition of total internal reflection from one-dimensional quasi-periodic dielectric multilayer structures with a thin absorbing front layer. Metals and dielectrics with complex dielectric constant are considered as an absorbing front layer material. We show that depending on the relationship between the real and imaginary pars of the dielectric constant of the absorbing layer there exist four types of angular resonance profiles in the reflected light intensity: dip, peak, dip-peak and peak-dip. Resonant multilayer dielectric structures with and without metal layer were created experimentally and the presence of a narrow dip in reflection and the increase of the evanescent field in the rare layer were confirmed.
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