Abstract

In order to elucidate the chemistry involved in thiourea adduct formation, a new promising separation of 2,6-dialkylnaphthalenes, the inclusion complex type of the thiourea adduct with mixture of dialkylnaphthalenes was studied using a powder X-ray diffraction method. A simple XRD pattern of both diethylnaphthalene (DEN) mixture-thiourea adduct and 2,6-DEN-thiourea adduct was observed. Peaks that appeared in the XRD pattern of the former, gave diffraction angles different from those of the latter. XRD peaks of the thiourea adduct with the mixture of 2,6-DEN and 2,6-diisopropylnaphthalene (DIPN) gave angles and intensities both different from those of 2,6-DEN-thiourea adduct and 2,6-DIPN-thiourea adduct. The results indicate that the adduct consists of a single solid inclusion complex in which more reactive dialkylnaphthalnenes (2,6-DEN, 2,7-DEN, 2,6-DIPN) are locked within like a solid solution. The expression of the equilibrium constant for the relevant adduct is also discussed.

Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call