Abstract
Abstract We propose a two-shot fringe analysis method for Fringe Patterns (FPs) with random phase-shift and changes in illumination components. These conditions reduce the acquisition time and simplify the experimental setup. Our method builds upon a Gabor Filter (GF) bank that eliminates noise and estimates the phase from the FPs. The GF bank allows us to obtain two phase maps with a sign ambiguity between them. Due to the fact that the random sign map is common to both computed phases, we can correct the sign ambiguity. We estimate a local phase-shift from the absolute wrapped residual between the estimated phases. Next, we robustly compute the global phase-shift. In order to unwrap the phase, we propose a robust procedure that interpolates unreliable phase regions obtained after applying the GF bank. We present numerical experiments that demonstrate the performance of our method.
Published Version
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