Two-wavelength phase-shifting method with four patterns for three-dimensional shape measurement

Abstract

Fringe projection technique has been widely used for three-dimensional (3D) shape measurement. However, it remains challenging to achieve high-speed measurement. A two-wavelength phase-shifting profilometry method with only four patterns is presented. Specifically, all these four patterns contain two wavelength components. The short wavelength component was used to compute the wrapped phase map, while the long one was used to unwrap the wrapped phase map. The performance of the proposed method was validated by both simulation study and experimental results.