Abstract
It is identified that the development of hydrogen-silsesquioxane resist after electron-beam exposure, by using a 25% tetramethylammonium-hydroxide (TMAH) developer, almost stops after 1min of development time and it severely limits the delineation of high-density nanometer-scale patterns. By using x-ray photoelectron spectroscopy, the authors identified that this development-stopping phenomenon is due to the formation of a siloxane-type bond structure which is insoluble to the TMAH developer. Here, the authors propose a two-step development method that involves the removal process of siloxane layer using a dilute hydrofluoric acid between development processes. This method successfully eliminates the insoluble layer, thus generating isolated high-density dot patterns with 25nm pitch.
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