Abstract
Tow-level system (TLS) loss in amorphous dielectric materials has been intensively studied at millikelvin temperatures due to its impact on superconducting qubit devices and incoherent detectors. However, the significance of TLS loss in superconducting transmission lines at liquid helium temperatures remains unclear. This study investigates TLS loss in amorphous SiO2 at liquid helium temperatures (about 4 K) within a frequency range of 130–170 GHz, using niobium microstrip and coplanar waveguide resonators. Our results demonstrate notable power and temperature dependence of dielectric loss, with the dielectric loss and quasiparticle loss exchanging dominance at around 4 K. These findings are consistent with TLS models and provide crucial insight for the design of superconducting devices operating at liquid helium temperatures.
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