Abstract
Two level current fluctuations (TLFs) are reported in a very large normal tunnel junction (area about 0-1 mm2) at liquid nitrogen temperature. Due to the presence of small Pt particles inside the tunnel barrier and the non-uniformity of a SiO insulator layer, very narrow current channels are created. TLFs are believed to result from single electrons trapped at defect sites within the insulator barrier of the junction. 1-V, total noise power versus bias and dl/AV characteristics were measured and a signal analysis of the TLFs was also performed.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
