Abstract
A 2D quasicrystal with an eightfold rotational axis has been found in rapidly solidified V-Ni-Si and Cr-Ni-Si alloys by means of transmission electron microscopy. The electron diffraction pattern taken along this axis shows no periodicity but a clear eightfold orientation symmetry. The corresponding high-resolution electron microscopic image agrees well with the 2D eightfold quasilattice consisting of squares and 45\ifmmode^\circ\else\textdegree\fi{} rhombi.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
