Two-dimensional hole localization induced by Zn, Ni, and Mg dopings in Cu sites in La1.85Sr0.15Cu1-x M x O y

Abstract

Samples of La1.85Sr0.15Cu1-xMxOy(M = Ni, Zn, and Mg) with a wide range of dopant concentration (0≤x≤0.30) were synthesized. X-ray diffraction analysis shows that the Zn doping results in a tetragonal-orthorhombic transition asx- >0.15. while both Ni- and Mg-doped samples still remain tetragonal up tox = 0.3. Furthermore, the Ni, Zn, and Mg dopings all reduce the local Jahn -Teller distortion of the CuO6 octahedron in a similar way. The metalinsulator transition at the region of higher doping levei (x> 0.1) is observed in all three doped systems. The observed metal-insulator transition can be well interpreted in the context of Anderson’s theory of disorder-induced localization. For most of the semiconducting-like samples with higher doping level (x> 0.1), the conductive behavior is dominated by two-dimensional variable-range-hopping (2D-VRH) with {ie-13-01} This suggests that all the dopings of Ni, Zn, and Mg in Cu sites cause the localization of the holes. In addition, a remarkable difference in the room-temperature resistivity for the heavily doped samples with the same dopant (Zn, Ni, Mg) concentrations is also observed. A possible explanation is provided for this phenomenon.