Abstract
The authors demonstrate both experimentally and numerically the high tunability that can be achieved in the optical response of sputtered multilayered metal-dielectric thin films. The wavelength dependence of both the transmission and reflectance is analyzed in terms of the geometrical parameters of transparent heterostructures consisting of alternating layers of Ag and SiO2. It is shown that these parameters can be adjusted to induce either a pass-band or a band-gap behavior in the visible range in a submicronic multilayered film.
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