Abstract
X-ray phase-contrast and dark-field imaging provides valuable, complementary information about the specimen under study. Among the multimodal X-ray imaging methods, X-ray grating interferometry and speckle-based imaging have drawn particular attention, which, however, in their common implementations incur certain limitations that can restrict their range of applications. Recently, the unified modulated pattern analysis (UMPA) approach was proposed to overcome these limitations and combine grating- and speckle-based imaging in a single approach. Here, we demonstrate the multimodal imaging capabilities of UMPA and highlight its tunable character regarding spatial resolution, signal sensitivity and scan time by using different reconstruction parameters.
Highlights
Acquired speckle imagesThe line profile plots in figures 2(c) and 2(d) through the sample (red) and reference (blue) speckle images demonstrate the modulations of the interference pattern
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Among the multimodal X-ray imaging methods, X-ray grating interferometry and speckle-based imaging have drawn particular attention, which, in their common implementations incur certain limitations that can restrict their range of applications
Summary
The line profile plots in figures 2(c) and 2(d) through the sample (red) and reference (blue) speckle images demonstrate the modulations of the interference pattern. Inside the sphere a reduction in intensity as well as a displacement of the speckles can be observed, while the visibility of the speckle pattern is essentially not affected. In figure 2(d) the speckle peaks are broadened and their visibility is strongly reduced due to the scattering nature of the wooden fibres. It can be observed that a few smaller additional peaks appear in the sample plot, which are due to edge enhancement fringes around the wooden fibres occurring upon free-space propagation
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