X-ray speckle-based phase-contrast imaging: principle and applications

Marie-Christine Zdora,Pierre Thibault,Irene Zanette,Ge Wang,Bert Müller

doi:10.1117/12.2595576

Marie-Christine Zdora, Pierre Thibault + Show 3 more

Open Access

https://doi.org/10.1117/12.2595576

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Abstract

X-ray speckle-based imaging (SBI), one of them most recent phase-contrast imaging methods, has received growing interest in the last years. Its simplicity, cost-effectiveness and robustness combined with the high phase sensitivity and compatibility with laboratory X-ray sources make it an attractive method for visualising even minute density differences in samples. Since its first demonstration, SBI has seen rapid development and a range of applications have been identified. Among the various ways to perform SBI, the unified modulated pattern analysis (UMPA) offers a number of advantages. Here, we present an overview of the state of the art of SBI, including some of our work using UMPA in the recent years. We demonstrate the potential of UMPA for applications such as optics characterisation, biomedical and geological imaging and discuss its translation from large-scale synchrotron facilities to the laboratory.

Highlights

X-ray phase-contrast imaging has become an established method for the investigation of samples with small density differences, for which it can reach superior contrast than conventional absorption imaging.[1]
We have presented an overview of speckle-based imaging (SBI) and our results obtained with unified modulated pattern analysis (UMPA) for various applications
The phase-contrast images obtained with UMPA show high phase sensitivity and deliver quantitative information on the phase shift and, in tomographic mode, on the electron density distribution within the sample

Summary

INTRODUCTION

X-ray phase-contrast imaging has become an established method for the investigation of samples with small density differences, for which it can reach superior contrast than conventional absorption imaging.[1]. SBI makes use of a random speckled intensity pattern, which is used as a wavefront marker These X-ray near-field speckles are created by a diffuser, such as a piece of sandpaper, comprised of small randomly distributed particles, which lead to scattering and interference of the illuminating X-rays. We give a short overview of the state of the art of SBI, focusing on the phase-contrast signal, and summarise some of our recent achievements and ongoing work. These include the optimisation of data acquisition and analysis routines, applications of SBI in various fields and our efforts of implementing SBI with a laboratory X-ray source. Proc. of SPIE Vol 11840 118400S-1 Downloaded From: https://www.spiedigitallibrary.org/conference-proceedings-of-spie on 24 Feb 2022 Terms of Use: https://www.spiedigitallibrary.org/terms-of-use

DATA ACQUISITION AND ANALYSIS METHODS

APPLICATIONS OF X-RAY SPECKLE-BASED IMAGING

X-Ray Optics Characterisation (a)

Imaging of Geological Samples

UMPA AT LABORATORY X-RAY SOURCES

SUMMARY AND CONCLUSIONS