Abstract
This paper investigates the influences of temperature and the trigger parameters (width and rise time) on the threshold of transient latch-up (TLU). It is shown that temperature is a much more critical parameter than transient trigger parameters. For high discharge currents which are typical for system-level surges as, e.g., seen in cable discharge events, even very short trigger pulses can cause TLU.
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More From: IEEE Transactions on Device and Materials Reliability
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