Abstract
The avalanche multiplication and excess noise properties of a range of submicron Si diodes have been measured and analyzed using a model for impact ionization which includes the effect of dead space, modified to allow for a gradual onset of ionization, with realistic threshold energies. Good agreement is achieved between the predictions of this “soft dead space” model and measurements of multiplication and excess noise, both on a range of submicron diodes with uniform electric fields and also on a p+n diode with a highly nonuniform electric field.
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