Abstract
Transverse translation diverse phase retrieval (TTDPR), a ptychographic image-based wavefront-sensing technique, is a viable method for optical shop testing due to its high accuracy and relatively simple experimental arrangement. However, when measuring a reflective optic, a normally hard-edged translating illumination will become soft-edged due to diffraction, which may reduce the accuracy of TTDPR by suppressing fine structures in measured data. In this Letter, we quantitatively explore the wavefront-sensing accuracy of TTDPR in the presence of soft-edged translating illumination.
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